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Beyond the vertical

By: Description: 3 pSubject(s): In: E & P Vol. 78, issue 9 (sept. 2005) ; p. 111-113Summary: Critical flow profiling has moved beyond technology that was designed for vertical wells. Layered flow as seen in horizontal and deviated wells demands a more complete picture of flow dynamics.
Item type: Artículo de Revista
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Biblioteca Alejandro Angel Bulgheroni Not for loan 200037765

Critical flow profiling has moved beyond technology that was designed for vertical wells. Layered flow as seen in horizontal and deviated wells demands a more complete picture of flow dynamics.



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