Synchrotron X-Ray Scattering as a Tool for Characterising Catalysts on Multiple Length Scales

Hudspeth, Jessica M. Kvashinina, Kristina O. Kimber, Simon A.J. Mitchell, Edward P.

Synchrotron X-Ray Scattering as a Tool for Characterising Catalysts on Multiple Length Scales - mayo/jun. 2015 - 7 p. ; 429-436

Transcripción del resumen del autor: Optimising the properties of catalysts for industrial processes requires a detailed knowledge of their structure and properties on multiple length scales. Synchrotron light sources are ideal tools for characterising catalyts for industrial R&D, providing data with high temporal and spatial resolution, under realistic operating conditions, in a non-destructive way. Here, we describe the different synchrotron techniques that can be employed to gain a wealth of complementary information, and highlight recent developments that have allowed remarkable insight to be gained into working catalytic systems. These techniques have the potential to guide future industrial catalyst design.

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